Title :
Sensitivity-based quantitative imaging using planar raster scanning
Author :
Sheng Tu ; Yifan Zhang ; Nikolova, Natalia K.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
Abstract :
A quantitative imaging method based on the self-adjoint sensitivity analysis of S-parameters is proposed. The estimation of the medium complex dielectric permittivity is achieved in real time. The method requires the measurement of two objects as part of the system calibration: a reference and a calibration object. The method is validated with simulation examples based on a planar raster-scanning acquisition.
Keywords :
calibration; microwave imaging; permittivity; sensitivity analysis; S-parameters; calibration object; medium complex dielectric permittivity; microwave imaging; planar raster scanning; planar raster-scanning acquisition; quantitative imaging method; self-adjoint sensitivity analysis; sensitivity-based quantitative imaging; system calibration; Calibration; Dielectrics; Frequency measurement; Imaging; Permittivity; Permittivity measurement; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
Print_ISBN :
978-1-4799-3538-3
DOI :
10.1109/APS.2014.6904666
