DocumentCode :
2465961
Title :
Measurement of magnetostrictive tensor components using electronic speckle pattern interferometry (ESPI)
Author :
Storch, M.L. ; Rollett, A.D. ; McHenry, M.E.
Author_Institution :
Carnegie Mellon University
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
489
Lastpage :
489
Keywords :
Interferometry; Magnetic field induced strain; Magnetic materials; Magnetostriction; Materials science and technology; Nonlinear equations; Paints; Publishing; Speckle; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872264
Filename :
872264
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2465961
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