• DocumentCode
    2466007
  • Title

    The spacecraft surfaces degradation and contamination caused by arcing in low density plasmas

  • Author

    Vayner, Boris V. ; Ferguson, Dale C. ; Galofaro, Joel T.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    824
  • Abstract
    Previous experience has shown that some surfaces of large spacecraft may have a high negative potential relative to the surrounding plasma. When this potential reaches a few hundred volts, electrical discharges (arcs) occur on the surface. One of the adverse consequences of arcing is the degradation of the thermal insulation and the contamination of local environment. To prevent the negative influence of these processes on the operation of spacecraft systems and scientific equipment, it seems necessary to determine the rate of degradation and plasma contamination vs. arc rate, amplitude of current, and the duration of arc. This report describes the results of experiments that have been done to study the rate of coating degradation, atomic composition of the material injected into the plasma, and the spatial distribution of the contaminating material
  • Keywords
    arcs (electric); ionospheric disturbances; space vehicles; surface discharges; thermal insulation; arc duration; arc rate; arcing; atomic composition; coating degradation; contaminating material spatial distribution; current amplitude; electrical discharges; high negative potential; low density plasmas; plasma contamination; scientific equipment operation; spacecraft surfaces contamination; spacecraft surfaces degradation; spacecraft systems operation; Aircraft manufacture; Insulation; NASA; Plasma density; Plasma materials processing; Power supplies; Space vehicles; Surface contamination; Surface discharges; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.738900
  • Filename
    738900