DocumentCode
2466007
Title
The spacecraft surfaces degradation and contamination caused by arcing in low density plasmas
Author
Vayner, Boris V. ; Ferguson, Dale C. ; Galofaro, Joel T.
Author_Institution
NASA Lewis Res. Center, Cleveland, OH, USA
Volume
2
fYear
1998
fDate
17-21 Aug 1998
Firstpage
824
Abstract
Previous experience has shown that some surfaces of large spacecraft may have a high negative potential relative to the surrounding plasma. When this potential reaches a few hundred volts, electrical discharges (arcs) occur on the surface. One of the adverse consequences of arcing is the degradation of the thermal insulation and the contamination of local environment. To prevent the negative influence of these processes on the operation of spacecraft systems and scientific equipment, it seems necessary to determine the rate of degradation and plasma contamination vs. arc rate, amplitude of current, and the duration of arc. This report describes the results of experiments that have been done to study the rate of coating degradation, atomic composition of the material injected into the plasma, and the spatial distribution of the contaminating material
Keywords
arcs (electric); ionospheric disturbances; space vehicles; surface discharges; thermal insulation; arc duration; arc rate; arcing; atomic composition; coating degradation; contaminating material spatial distribution; current amplitude; electrical discharges; high negative potential; low density plasmas; plasma contamination; scientific equipment operation; spacecraft surfaces contamination; spacecraft surfaces degradation; spacecraft systems operation; Aircraft manufacture; Insulation; NASA; Plasma density; Plasma materials processing; Power supplies; Space vehicles; Surface contamination; Surface discharges; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.738900
Filename
738900
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