Title :
Assessment of novel phase change memory programming techniques
Author :
Liao, Yi-Bo ; Lin, Jun-Tin ; Chiang, Meng-Hsueh ; Hsu, Wei-Chou
Author_Institution :
Inst. of Microelectron., Nat. Cheng Kung Univ, Tainan
Abstract :
In this paper, we present novel phase change memory programming techniques achieving low power operation without compromising performance by using proper pulsing schemes. By applying continuous current pulses at a fixed frequency or with the same pulse magnitude, binary data are successfully written into memory cells. The proposed programming techniques can be implemented with more flexible or simplified circuitry since a single current level is shown to be sufficient for write operations of both set and reset states.
Keywords :
phase change memories; programming; binary data; continuous current pulses; low power operation; memory cells; phase change memory programming; pulsing schemes; Amorphous materials; Crystalline materials; Crystallization; Energy consumption; Frequency; Nonvolatile memory; Phase change materials; Phase change memory; Resistance heating; Temperature; Phase change memory; non-volatile memory;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
DOI :
10.1109/EDSSC.2008.4760662