DocumentCode
2466240
Title
Evolution of barrier properties in magnetic tunnel junctions by annealing
Author
Schmalhorst, J. ; Thomas, A. ; Justus, M. ; Reiss, G. ; Bruckl, H. ; Vieth, M. ; Gieres, G. ; Wecker, J.
Author_Institution
University of Bielefeld
fYear
2000
fDate
9-13 April 2000
Firstpage
507
Lastpage
507
Keywords
Annealing; Atomic force microscopy; Electrical resistance measurement; Electrons; Magnetic field measurement; Magnetic properties; Magnetic tunneling; Plasma temperature; Saturation magnetization; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872282
Filename
872282
Link To Document