DocumentCode
2466810
Title
Cascaded classification for hardware face detection
Author
Zheng, Irene ; Zhang, Xiaoxiao ; Flitti, Farid ; Bermak, Amine
Author_Institution
ECE Dept., Hong Kong Univ. of Sci. & Technol, Hong Kong
fYear
2008
fDate
8-10 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
This paper presents a face detection hardware architecture which is based on a newly proposed algorithm using cascaded classifiers with vector angle similarity measurement between the investigated image and the face/non-face centroids. The proposed system is composed of three major modules: Best fit plane removal unit, Histogram equalization unit, and cascaded classification unit. Comprehensive optimization at both the algorithmic and hardware levels has enabled performance improvement and area reduction. The vector angle similarity measure-based algorithm is employed to achieve acceptable classification accuracy and high-speed. The cascaded classification architecture is designed in a parallel mode to achieve low latency and low iteration time. The overall system was designed in VHDL and synthesized and implemented using Xilinx FPGA vertex4 family board. Experimental results on real-time captured face images prove the system reliability and achievement of real-time classification performance which is comparable to a software implementation while running at a frame rate of 63 frames per second at an image resolution of 64times64 pixels. The proposed architecture is scalable and can be extended to higher resolution.
Keywords
face recognition; field programmable gate arrays; hardware description languages; image classification; optimisation; VHDL; Xilinx FPGA; best fit plane removal unit; cascaded classification unit; comprehensive optimization; face/non-face centroids; hardware architecture; hardware face detection; histogram equalization unit; system reliability; Delay; Face detection; Field programmable gate arrays; Goniometers; Hardware; Histograms; Image resolution; Real time systems; Reliability; Software performance; FPGA; best fit plane removal; classification; face detection; histogram equalization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-2539-6
Electronic_ISBN
978-1-4244-2540-2
Type
conf
DOI
10.1109/EDSSC.2008.4760695
Filename
4760695
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