Title :
An Immune Fault Detection System for Analog Circuits with Automatic Detector Generation
Author :
Amaral, Jorge L M ; Amaral, Jose F M ; Tanscheit, Ricardo
Author_Institution :
State Univ. of Rio de Janeiro, Rio de Janeiro
Abstract :
This work focuses on fault detection of electronic analog circuits. A fault detection system for analog circuits based on cross-correlation and artificial immune system is proposed. It is capable of detecting faulty components in analog circuits by analyzing its impulse response. The use of cross-correlation for preprocessing the impulse response drastically reduces the size of the detector used by the real-valued negative selection algorithm (RNSA). The proposed method can automatically generate very efficient detectors by using quadtree decomposition. Results have demonstrated that the proposed system is able to detect faults in a Sallen-Key bandpass filter and in a continuous-time state variable filter.
Keywords :
analogue circuits; artificial intelligence; electronic engineering computing; fault location; quadtrees; Sallen-Key bandpass filter; artificial immune systems; automatic detector generation; continuous-time state variable filter; cross-correlation; electronic analog circuits; immune fault detection system; impulse response; quadtree decomposition; real-valued negative selection algorithm; Analog circuits; Artificial immune systems; Band pass filters; Circuit faults; Circuit testing; Detectors; Electrical fault detection; Fault detection; Fault diagnosis; Immune system;
Conference_Titel :
Evolutionary Computation, 2006. CEC 2006. IEEE Congress on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-9487-9
DOI :
10.1109/CEC.2006.1688682