• DocumentCode
    2466971
  • Title

    A total error rate multi-class classification

  • Author

    Wang, Xizhao ; Zhang, Meng ; Lu, Shuxia ; Zhou, Xu

  • Author_Institution
    Key Lab. of Machine Learning & Comput. Intell., Hebei Univ., Baoding, China
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    964
  • Lastpage
    969
  • Abstract
    The total error rate (TER) has been presented as a minimum classification error model for the single-layer feed-forward network (SLFN) learning. The TER, which uses one-against-all (OAA) for multi-class classification, may cause unbalanced data set especially for large number of training data in multi-class classification and then often has a bad influence on the accuracy. This paper proposes a new method, called multi-class total error rate (MTER) to deal with this problem. The MTER, which uses a unified learning mode of regression and multi-class classification and minimizes the error rate for each class, can approximate any target functions. It implies that a balanced data set can be obtained and the training process can be simplified. Experiments show that MTER has a higher accuracy and lower computational complexity in comparison with some learning algorithms such as ELM and TER. The experiments also show that the MTER has a similar performance with LIBSVM.
  • Keywords
    error statistics; feedforward neural nets; learning (artificial intelligence); regression analysis; MTER; OAA; SLFN learning; minimum classification error model; multiclass total error rate; one-against-all; regression analysis; single-layer feed-forward network; total error rate multiclass classification; unified learning mode; Accuracy; Approximation methods; Equations; Error analysis; Mathematical model; Training; Training data; Extreme learning Machine; One-against-all; Total error rate; multi-class classification; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics (SMC), 2012 IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4673-1713-9
  • Electronic_ISBN
    978-1-4673-1712-2
  • Type

    conf

  • DOI
    10.1109/ICSMC.2012.6377853
  • Filename
    6377853