DocumentCode :
2467165
Title :
A dual band CMOS two-stage variable gain low noise amplifier
Author :
Li, Juan ; Zhao, Feng ; Huang, Yumei ; Hong, Zhiliang
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai
fYear :
2008
fDate :
8-10 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
A low power CMOS fully-integrated on-chip inductor-less low noise amplifier (LNA) designed for short range devices (SRDs) in 0.25-mum CMOS process is presented. It is working at 315 MHz and 433 MHz. Common gate input topology is adopted to realize wideband impedance matching without tuning. Cross coupled common-gate input technique is adopted to improve the noise performance of conventional common-gate LNA. Two-stage variable gain architecture is used to optimize the gain, noise and linearity simultaneously. The simulated S11 is below -17 dB across the entire band and the minimum noise figure is 2.55 dB when the gain is set to the highest. The LNA provides a gain control range of 36 dB and the simulated IIP3 is -2.7 dBm. The power consumption is 5.5 mW without the output buffer at a 2.5 V supply voltage. The core circuit area is 0.33 mm times 0.18 mm.
Keywords :
CMOS integrated circuits; UHF amplifiers; UHF integrated circuits; impedance matching; integrated circuit design; low noise amplifiers; common gate input topology; cross coupled common-gate input technique; dual band CMOS amplifier; frequency 315 MHz; frequency 433 MHz; fully-integrated on-chip inductor-less LNA; gain 36 dB; gain optimization; noise figure 2.55 dB; power 5.5 mW; short range devices; size 0.25 mum; two-stage variable gain low noise amplifier; voltage 2.5 V; wideband impedance matching; Broadband amplifiers; CMOS process; Dual band; Gain; Impedance matching; Linearity; Low-noise amplifiers; Noise figure; Topology; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
Type :
conf
DOI :
10.1109/EDSSC.2008.4760712
Filename :
4760712
Link To Document :
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