Title :
Voltage gradient limitation of IGBTS by optimised gate-current profiles
Author :
Schmitt, G. ; Kennel, R. ; Holtz, J.
Author_Institution :
Electr. Machines & Drives, Wuppertal Univ., Wuppertal
Abstract :
Using MOS-controlled semiconductors provide the opportunity to directly affect the voltage and currents gradients during the switching transients at the gate. An active gate driver is presented that imposes optimised gate current profiles in order to limit the dv/dt and di/dt. When limiting the dv/dt to 1 kV/mus the switching losses are be reduced by 35% in comparison to the common limitation method by gate resistor. The switch-off losses are improved about 10% by employing an optimised gate signal.
Keywords :
MOSFET; driver circuits; insulated gate bipolar transistors; losses; power semiconductor devices; resistors; transient analysis; IGBT; MOS-controlled semiconductors; active gate driver; currents gradients; gate resistor; optimised gate-current profiles; switching losses; switching transients; voltage gradient limitation; Costs; Driver circuits; Filters; Flexible AC transmission systems; Insulated gate bipolar transistors; Medium voltage; Power semiconductor switches; Resistors; Stress; Switching loss;
Conference_Titel :
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location :
Rhodes
Print_ISBN :
978-1-4244-1667-7
Electronic_ISBN :
0275-9306
DOI :
10.1109/PESC.2008.4592512