DocumentCode :
2467281
Title :
Multichannel integrated system for fast X-ray imaging applications
Author :
Szczygiel, R. ; Grybos, P. ; Maj, P. ; Tsukiyama, A. ; Matsushita, K. ; Taguchi, T.
Author_Institution :
Dept. of Meas. & Instrum., AGH Univ. of Sci. & Technol., Krakow, Poland
fYear :
2010
fDate :
14-17 March 2010
Firstpage :
1587
Lastpage :
1590
Abstract :
We present an integrated system based on a silicon strip detector and integrated circuits (IC) called RG64 for low energy X-ray imaging application. This system is used in fast position sensitive measurements with the possibility of selecting X-ray photons according their energy. The silicon strip detector used in this system has 128 strips with a pitch of 100 μm. The readout integrated circuit RG64 has 64-channel architecture and operates the single photon counting mode. Each channel is built of a charge sensitive amplifier with a second order shaper of 75 ns peaking time, two independent discriminators with an 8-bit offset correction circuit and two independent 20-bit counters with RAM memory buffers. The integrated circuit is optimized for low noise operation in with high frequency of input pulses. The equivalent noise charge of the circuit is equal to 126 el. rms (with 1 pF input load and 5 mW power consumption per single channel) and it operates up to 2 Mcps of average rate of input pulses. The mean gain in the multichannel IC is about 50 μV/el. and the effective threshold voltage spread for given energy calculated to the input is less than 7 el. rms.
Keywords :
X-ray imaging; application specific integrated circuits; position measurement; random-access storage; readout electronics; 20-bit counters; 64-channel architecture; 8-bit offset correction circuit; RAM memory buffers; X-ray imaging applications; X-ray photons; charge sensitive amplifier; circuit noise; input pulses; low noise operation; multichannel integrated system; position sensitive measurements; power 5 mW; power consumption; readout integrated circuit RG64; silicon strip detector; single photon counting mode; size 100 mum; threshold voltage; time 75 ns; Application specific integrated circuits; Energy measurement; Integrated circuit noise; Photonic integrated circuits; Pulse amplifiers; Silicon; Strips; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology (ICIT), 2010 IEEE International Conference on
Conference_Location :
Vi a del Mar
Print_ISBN :
978-1-4244-5695-6
Electronic_ISBN :
978-1-4244-5696-3
Type :
conf
DOI :
10.1109/ICIT.2010.5472451
Filename :
5472451
Link To Document :
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