• DocumentCode
    2467328
  • Title

    Beam optics analysis - a 3D finite element charged particle code with adaptive meshing

  • Author

    Bui, Thuc ; Vogler, Bill ; Ives, Lawrence ; Shephard, Mark ; Klaas, Ottmar ; Remacle, Jean Francois ; Kapraun, Dustin ; Tran, Hien

  • Author_Institution
    Calabazas Creek Res. Inc., Saratoga, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    160
  • Lastpage
    161
  • Abstract
    Development of the next generation of RF devices is in progress with research on sheet beam and multiple beam devices on-going at several institutions. Analysis of inherently three dimensional devices requires a new set of analytical tools to model the electromagnetic fields and the behavior of electron and ion beams. Existing codes, such as HFSS and MAFIA, are widely used to model the electromagnetic fields in these devices, but there is a need for simple, accurate, and efficient codes to model the behavior of charged particles in 3D geometries and fields. Calabazas Creek Research, Inc. (CCR) is funded by the U.S. Department of Energy to develop a finite element, charged particle, analysis code suitable for the next generation of RF devices. The principle feature of the new program is adaptive meshing, which removes the burden for mesh generation from the user and assigns responsibility to field solver and particle pusher routines.
  • Keywords
    electromagnetic fields; finite element analysis; mesh generation; particle optics; 3D finite element charged particle code; RF device; adaptive meshing; beam optics analysis; electromagnetic field; electron beam; ion beam; multiple beam device; sheet beam device; three-dimensional device; Adaptive optics; Analytical models; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Finite element methods; Optical beams; Particle beams; Radio frequency; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
  • Print_ISBN
    0-7803-7256-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2002.999314
  • Filename
    999314