Title :
Refinements to the MICHELLE Secondary Electron Emission model for simulating multi-stage depressed collector operation
Author :
Dionne, Norman J. ; Petillo, John J.
Author_Institution :
Raytheon Co., Sudbury, MA, USA
Abstract :
The Secondary Electron Emission model in the MICHELLE code has undergone several refinements over the past year. MICHELLE, an advanced, three-dimensional electron beam design tool is currently under development by a team lead by SAIC under NRL/ONR sponsorship. As part of this new effort, an algorithmic representation of a comprehensive model of secondary emission is being developed for this computational tool in order to achieve an accurate beam collection design capability.
Keywords :
secondary electron emission; MICHELLE simulation code; multi-stage depressed collector operation; secondary electron emission model; three-dimensional electron beam collection design; Carbon dioxide; Delay effects; Electrodes; Electron beams; Electron emission; Gyrotrons; Klystrons; Radio frequency; Refining; Thermal stresses;
Conference_Titel :
Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
Print_ISBN :
0-7803-7256-5
DOI :
10.1109/IVELEC.2002.999315
