• DocumentCode
    2467413
  • Title

    A data-driven modeling approach to stochastic computation for low-energy biomedical devices

  • Author

    Lee, Kyong Ho ; Jang, Kuk Jin ; Shoeb, Ali ; Verma, Naveen

  • Author_Institution
    Princeton University, Princeton, NJ 08540 USA
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    826
  • Lastpage
    829
  • Abstract
    Low-power devices that can detect clinically relevant correlations in physiologically-complex patient signals can enable systems capable of closed-loop response (e.g., controlled actuation of therapeutic stimulators, continuous recording of disease states, etc.). In ultra-low-power platforms, however, hardware error sources are becoming increasingly limiting. In this paper, we present how data-driven methods, which allow us to accurately model physiological signals, also allow us to effectively model and overcome prominent hardware error sources with nearly no additional overhead. Two applications, EEG-based seizure detection and ECG-based arrhythmia-beat classification, are synthesized to a logic-gate implementation, and two prominent error sources are introduced: (1) SRAM bit-cell errors and (2) logic-gate switching errors (‘stuck-at’ faults). Using patient data from the CHB-MIT and MIT-BIH databases, performance similar to error-free hardware is achieved even for very high fault rates (up to 0.5 for SRAMs and 7×10−2 for logic) that cause computational bit error rates as high as 50%.
  • Keywords
    Brain modeling; Computational modeling; Detectors; Feature extraction; Hardware; Random access memory; Support vector machines; Algorithms; Arrhythmias, Cardiac; Data Interpretation, Statistical; Electric Power Supplies; Electrocardiography; Electroencephalography; Equipment Failure; Humans; Reproducibility of Results; Seizures; Sensitivity and Specificity; Stochastic Processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6090189
  • Filename
    6090189