DocumentCode
2467711
Title
Elitist Teaching Learning Opposition based algorithm for global optimization
Author
Rajasekhar, Anguluri ; Rani, Rapol ; Ramya, Kolli ; Abraham, Ajith
Author_Institution
Dept. of Electr. & Electron. Eng., Nat. Inst. of Technol. Warangal, Warangal, India
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
1124
Lastpage
1129
Abstract
In this paper, a new variant of Teaching-Learning based Optimization (TLBO), termed as Elitist Teaching-Learning Opposition based (ETLOBA) Algorithm has been proposed for numerical function optimization. The proposed method is empowered with two mechanisms to reach the accurate global optimum with less time complexity. One of them is elitism, which strengthens the capability of optimization method by retaining the best solution obtained so far, on the other hand Opposition method helps in ameliorating the capability of searching. As ETLOBA had an advantage of both Elitism and Opposition based learning, hence it tries to obtain optimum solutions with guaranteed convergence. The proposed method has been tested on several benchmark functions and the results obtained by ETLOBA are been compared with new state-of-art optimization methods like ABC, HS etc., shows the superiority of the proposed approach in solving continuous optimization problems.
Keywords
computational complexity; learning (artificial intelligence); optimisation; teaching; ETLOBA; TLBO; benchmark functions; continuous optimization problems; elitism based learning; elitist teaching learning opposition based algorithm; global optimization; global optimum; guaranteed convergence; numerical function optimization; opposition based learning; opposition method; optimum solutions; state-of-art optimization methods; teaching-learning based optimization; time complexity; Benchmark testing; Convergence; Education; Electronic mail; Optimization methods; Standards; artificial bee colony; elitism; global optimization; oppostion learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics (SMC), 2012 IEEE International Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4673-1713-9
Electronic_ISBN
978-1-4673-1712-2
Type
conf
DOI
10.1109/ICSMC.2012.6377882
Filename
6377882
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