DocumentCode :
2467837
Title :
A valuation for clear stain and its behaver on helical scan tape system
Author :
Nagai, N. ; Kamatani, Y. ; Kondo, M. ; Ozue, T.
Author_Institution :
Sony Corporation
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
589
Lastpage :
589
Keywords :
Atomic force microscopy; Cost accounting; Frequency measurement; Magnetic heads; Microwave integrated circuits; Optical losses; Optical microscopy; Optical recording; System testing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872364
Filename :
872364
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2467837
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