• DocumentCode
    2467847
  • Title

    CFA noise modeling using MASK

  • Author

    Guss, W.C. ; Tracy, M.L.

  • Author_Institution
    Beverly Microwave Div., CPI, Beverly, MA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    204
  • Abstract
    Low-noise CFA operation regimes have been observed experimentally, and computationally modeled. Access to low-noise operation is observed for low magnetic field and high cathode emission current. The 2 1/2 -D PIC code MASK has successfully modeled CFA operational parameters such as anode voltage and current, and output RF gain. It has also demonstrated the ability to model signal-to-noise values for both high and low noise CFA operation. The low-noise simulation results are dependent on the number of macro-particles and the numerical discretization noise associated with density fluctuations resulting from a finite number of simulation macro-particles. Using suitably large number of macro-particles, we have used MASK including a multi-conductor transmission line (MTL) circuit model to model a particular CPI crossed-field amplifier SFD-266/VXS-1925. The MTL model reproduces the observed circuit dispersion curve closely. The goal of this study is the modeling of CFA noise as function of cathode thermionic emission and magnetic field, and the comparison of the simulation results with observed noise levels.
  • Keywords
    circuit noise; electronic engineering computing; microwave amplifiers; microwave tubes; transmission line theory; 2 1/2 -D PIC code; MASK code; cathode thermionic emission; circuit dispersion curve; crossed-field amplifier; density fluctuations; high cathode emission current; low magnetic field; low-noise operation; multi-conductor transmission line circuit model; noise modeling; numerical discretization noise; Anodes; Cathodes; Circuit noise; Circuit simulation; Computational modeling; Magnetic fields; Magnetic noise; Noise level; Radio frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
  • Print_ISBN
    0-7803-7256-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2002.999338
  • Filename
    999338