Title :
Mechanical Integrity of Piezoelectric and Dielectric Ceramics
Author :
Koepke, B.G. ; McHenry, K.D. ; Seifried, L.M. ; Stokes, R.J.
Keywords :
Capacitors; Ceramics; Delay; Dielectric materials; Equations; Ferroelectric materials; Nonhomogeneous media; Piezoelectric materials; Surface cracks; Tensile stress;
Conference_Titel :
IEEE 1986 Ultrasonics Symposium
Conference_Location :
Williamsburg, VA, USA
DOI :
10.1109/ULTSYM.1986.198821