DocumentCode
2467968
Title
Reliability prediction based on degradation measure distribution and wavelet neural network
Author
Dang, Xiangjun ; Jiang, Tongmin
Author_Institution
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
23-25 May 2012
Firstpage
1
Lastpage
5
Abstract
To avoid the errors caused by pseudo life prediction in degradation testing, this paper proposes a reliability prediction method based on degradation measure distribution and wavelet neural network. The style of degradation measure distribution is assumed to be unchangeable during degradation procedure, while the character parameters, such as location and scale parameters, are time-dependent covariates. Therefore, the evaluations of character parameters are critical factors for prediction results. To predict the character parameters, different wavelet neural network prediction models are established. The learning algorithm of wavelet neural network is Levenberg-Marquardt algorithm combining the advantages of both Gauss-Newton algorithm and fast gradient descent algorithm. Practical degradation data are utilized to verify the proposed method. Considering that data may not be intact in engineering, reliability prediction of partial degradation data is also implemented and the result is acceptable.
Keywords
gradient methods; learning (artificial intelligence); least squares approximations; neural nets; reliability; testing; wavelet transforms; Gauss-Newton algorithm; Levenberg-Marquardt algorithm; character parameters; degradation measure distribution; degradation procedure; degradation testing; fast gradient descent algorithm; learning algorithm; location parameters; partial degradation data; pseudo life prediction; reliability prediction method; scale parameters; time-dependent covariates; wavelet neural network prediction models; Argon; Hazards; Polynomials; Prediction algorithms; Predictive models; Reliability; degradation measure distribution; reliability prediction; wavelet neural network;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location
Beijing
ISSN
2166-563X
Print_ISBN
978-1-4577-1909-7
Electronic_ISBN
2166-563X
Type
conf
DOI
10.1109/PHM.2012.6228782
Filename
6228782
Link To Document