• DocumentCode
    2468073
  • Title

    Impacts of large-scale integration of PV based generations in a mesh-connected low voltage network

  • Author

    Bhattacharyya, Souvik ; Cobben, Sjef ; Toonen, Joost

  • Author_Institution
    Endinet, Alliander, Eindhoven, Netherlands
  • fYear
    213
  • fDate
    10-13 June 213
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In the recent years more and more photovoltaic (PV) panels are being installed at various low voltage (LV) customers´ installations that are connected to the public network. As a result, the conventional unidirectional power flow is being gradually changed to a bidirectional power flow which might have significant impact on the network´s voltage quality. In the coming years, Endinet, as a network operator, has to face this challenge too and should adapt its present network infrastructure as per predicted needs. Endinet has a mesh connected LV network to deliver reliable good quality electric supply to the customers. This type of network infrastructure is not very common in the Netherlands. Therefore, the impact of large-scale integration of PV panels in such type of meshed network is not very well known. In this paper, the simulation results of a typical mesh connected LV network are discussed for different scenarios of PV panels integration in the grid. From analysis, the loading of various network components and network´s voltage quality at various node points are forecasted.
  • Keywords
    load flow; photovoltaic power systems; power generation reliability; power grids; power supply quality; solar cell arrays; Endinet network operator; PV based generations; PV panel integration; bidirectional power flow; electric supply quality; large-scale integration impact; mesh connected LV network; mesh-connected low voltage network; network infrastructure; network voltage quality; photovoltaic panels; unidirectional power flow;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Electricity Distribution (CIRED 2013), 22nd International Conference and Exhibition on
  • Conference_Location
    Stockholm
  • Electronic_ISBN
    978-1-84919-732-8
  • Type

    conf

  • DOI
    10.1049/cp.2013.0637
  • Filename
    6683240