DocumentCode :
2468202
Title :
EMP mitigation technique based on low pressure SF6 gas filled surge suppressor
Author :
Sharma, Archana ; Mittal, K.C.
Author_Institution :
Accelerator & Pulse Power Div., Bhabha Atomic Res. Centre, Mumbai, India
fYear :
2002
fDate :
2002
Firstpage :
238
Lastpage :
239
Abstract :
Summary form only given. The aim of this study was to develop a device to suppress fast electromagnetic pulse (EMP) in a few nanoseconds. When electronic equipment or a power line is subjected to a transient from intense and fast electromagnetic interference (EMI) sources, the consequences are temporary upset or permanent damage of the equipment. Important among such intense EMI sources are lightning strikes, high power microwave (HPM) and nuclear electromagnetic pulse (NEMP). EMI coupling to these equipments can be through conduction or radiation. To protect the equipment against such surges, the surge suppressors are connected across power lines and/or signal lines. The impedance of an arrestor is a function of the voltage impressed on it. Commonly used surge suppressors are metal oxide varistors, transient absorbers and spark gaps. Among these protective elements, the spark gaps have the outstanding advantages of high-energy absorption, low self-capacitance, low clamping voltage and high speed. Results of detailed experimental study are presented for the fast surge suppression using low-pressure SF6 spark gaps.
Keywords :
electromagnetic pulse; lightning protection; spark gaps; sulphur compounds; surge protection; EMP mitigation technique; SF6; clamping voltage; fast electromagnetic interference; gas filled surge suppressor; high power microwave; high-energy absorption; lightning strikes; nuclear electromagnetic pulse; self-capacitance; EMP radiation effects; Electromagnetic interference; Electromagnetic transients; Electronic equipment; Impedance; Lightning; Microwave devices; Nanoscale devices; Spark gaps; Surge protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
Print_ISBN :
0-7803-7256-5
Type :
conf
DOI :
10.1109/IVELEC.2002.999357
Filename :
999357
Link To Document :
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