Title :
Techniques for the Characterization of Film Adhesion
Author :
Addison, R.C., Jr. ; Somekh, M. ; Briggs, G.A.D.
Keywords :
Acoustic measurements; Adhesives; Bonding forces; Coatings; Force measurement; Measurement techniques; Stress; Substrates; Surface acoustic waves; Transistors;
Conference_Titel :
IEEE 1986 Ultrasonics Symposium
Conference_Location :
Williamsburg, VA, USA
DOI :
10.1109/ULTSYM.1986.198840
