• DocumentCode
    2468290
  • Title

    Effect of the intrinsic layer thickness on the spectral performance of p-i-n structure 4H-SiC ultraviolet photodetector

  • Author

    Chen, Xiaping ; Wu, Zhengyun ; Zhu, Huili

  • Author_Institution
    Physics Department & MEMS Research Center, Xiamen University, Fujian, 361005, China
  • fYear
    2011
  • fDate
    24-26 June 2011
  • Firstpage
    5918
  • Lastpage
    5921
  • Abstract
    The absorption coefficients of 4H-SiC at 200 – 400 nm were obtained by extrapolation and polynomial fitting methods. Considering the effect of different junction-depth on the spectral performance, the continuity equations of photo-generated minority carrier were used to theoretically calculate the responsivity of p+-n(i)-n-n+ structure 4H-SiC ultraviolet photodetector (PD) and to find out the effect of the intrinsic layer thickness on the spectral performance. The theoretical analyses can be applied to the practical design of p-i-n structure 4H-SiC PDs.
  • Keywords
    Absorption; Electronic mail; Neodymium; PIN photodiodes; Physics; Silicon carbide; 4H-SiC; intrinsic layer; p-i-n PDs; spectral performance; theoretical analyse;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Remote Sensing, Environment and Transportation Engineering (RSETE), 2011 International Conference on
  • Conference_Location
    Nanjing, China
  • Print_ISBN
    978-1-4244-9172-8
  • Type

    conf

  • DOI
    10.1109/RSETE.2011.5965701
  • Filename
    5965701