• DocumentCode
    2468324
  • Title

    Research on diagnostics and prognostics of FPGA-based system

  • Author

    Gao, Cheng ; Guo, Wei ; Sun, Yue

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.
  • Keywords
    built-in self test; field programmable gate arrays; logic testing; table lookup; FPGA-based system; built-in self test; diagnostic techniques; failure models; look-up table; prognostic techniques; programmable logic blocks; Built-in self-test; Electromigration; Field programmable gate arrays; Heating; Ice; Routing; Table lookup; BIST; FPGA; fault models; physics of failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management (PHM), 2012 IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    2166-563X
  • Print_ISBN
    978-1-4577-1909-7
  • Electronic_ISBN
    2166-563X
  • Type

    conf

  • DOI
    10.1109/PHM.2012.6228798
  • Filename
    6228798