Title :
Research on diagnostics and prognostics of FPGA-based system
Author :
Gao, Cheng ; Guo, Wei ; Sun, Yue
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.
Keywords :
built-in self test; field programmable gate arrays; logic testing; table lookup; FPGA-based system; built-in self test; diagnostic techniques; failure models; look-up table; prognostic techniques; programmable logic blocks; Built-in self-test; Electromigration; Field programmable gate arrays; Heating; Ice; Routing; Table lookup; BIST; FPGA; fault models; physics of failure;
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
DOI :
10.1109/PHM.2012.6228798
