Title :
The good, the bad, and the ugly of silicon debug
Author_Institution :
Intel Corp., Fort Collins, CO
Abstract :
Silicon debug begins with the arrival of design prototypes and can continue well after a product has gone into production. It is perhaps the most exciting and challenging stage of the integrated circuit development process. This paper gives an overview of silicon debug, and describes tools and methods used during the debug process
Keywords :
integrated circuit design; integrated circuit testing; design prototypes; integrated circuit development; silicon debug; Circuit testing; Computer bugs; Frequency; Logic circuits; Logic design; Logic devices; Manufacturing processes; Process design; Silicon; Voltage; Debug; Design; characterization; design for test and debug; validation; verification;
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
1-59593-381-6
DOI :
10.1109/DAC.2006.238674
