• DocumentCode
    2468444
  • Title

    Generation of yield-aware Pareto surfaces for hierarchical circuit design space exploration

  • Author

    Tiwary, Saurabh K. ; Tiwary, Pragati K. ; Rutenbar, Rob A.

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    Pareto surfaces in the performance space determine the range of feasible performance values for a circuit topology in a given technology. We present a non-dominated sorting based global optimization algorithm to generate the nominal Pareto front efficiently using a simulator-in-a-loop approach. The solutions on this Pareto front combined with efficient Monte Carlo approximation ideas are then used to compute the yield-aware Pareto fronts. We show experimental results for both the nominal and yield-aware Pareto fronts for power and phase noise for a voltage controlled oscillator (VCO) circuit. The presented methodology computes yield-aware Pareto fronts in approximately 5-6 times the time required for a single circuit synthesis run and is thus practically efficient. We also show applications of yield-aware Paretos to find the optimal VCO circuit to meet the system level specifications of a phase locked loop
  • Keywords
    Monte Carlo methods; Pareto optimisation; circuit optimisation; integrated circuit design; integrated circuit yield; network topology; Monte Carlo approximation; circuit synthesis; circuit topology; design space exploration; global optimization algorithm; hierarchical circuit; nondominated sorting; phase noise; simulator-in-a-loop; voltage controlled oscillator; yield-aware Pareto surfaces; Circuit simulation; Circuit synthesis; Circuit topology; Computational modeling; Monte Carlo methods; Pareto optimization; Sorting; Space exploration; Space technology; Voltage-controlled oscillators; Algorithms Design; Yield; optimization; pareto surfaces; performance space;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229172
  • Filename
    1688755