Title :
A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn
Author :
Qiang Chen ; Chen, Yunxia ; Kang, Rui
Author_Institution :
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.
Keywords :
approximation theory; entropy; life testing; thin film resistors; MC-ApEn method; accelerated degradation mechanism consistency; conductive film resistors; discriminant method; enhancement testing; moving cut data-approximate entropy method; new judgment method; Arrays; Educational institutions; Reliability; MC-ApEn; degradation mechanism consistency; enhancement testing;
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
DOI :
10.1109/PHM.2012.6228820
