DocumentCode :
2468808
Title :
Timing driven power gating
Author :
Chiou, De-Shiuan ; Chen, Shih-Hsin ; Chang, Shih-Chieh ; Yeh, Chingwei
Author_Institution :
Dept. of Comput. Sci., National Tsing Hua Univ., Hsinchu
fYear :
0
fDate :
0-0 0
Firstpage :
121
Lastpage :
124
Abstract :
Power gating is effective for reducing leakage power. Previously, a distributed sleep transistor network (DSTN) was proposed to reduce the sleep transistor area by connecting all the virtual ground lines together to minimize the maximum instantaneous current (MIC) through sleep transistors. In this paper, we propose a new methodology for determining the size of sleep transistors for the DSTN structure. We present novel algorithms and theorems for efficiently estimating a tight upper bound of the voltage drop. We also present efficient heurists for minimizing the sizes of sleep transistors. Our experimental results are very exciting
Keywords :
CMOS integrated circuits; integrated circuit design; leakage currents; distributed sleep transistor network; leakage current; maximum instantaneous current; power gating; sleep transistor area; virtual ground lines; Circuit simulation; Degradation; Estimation theory; Joining processes; Leakage current; Microwave integrated circuits; Performance analysis; Threshold voltage; Timing; Upper bound; Design; IR Drop; Leakage Current; Performance; Power Gating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
1-59593-381-6
Type :
conf
DOI :
10.1109/DAC.2006.229189
Filename :
1688774
Link To Document :
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