• DocumentCode
    2468808
  • Title

    Timing driven power gating

  • Author

    Chiou, De-Shiuan ; Chen, Shih-Hsin ; Chang, Shih-Chieh ; Yeh, Chingwei

  • Author_Institution
    Dept. of Comput. Sci., National Tsing Hua Univ., Hsinchu
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    121
  • Lastpage
    124
  • Abstract
    Power gating is effective for reducing leakage power. Previously, a distributed sleep transistor network (DSTN) was proposed to reduce the sleep transistor area by connecting all the virtual ground lines together to minimize the maximum instantaneous current (MIC) through sleep transistors. In this paper, we propose a new methodology for determining the size of sleep transistors for the DSTN structure. We present novel algorithms and theorems for efficiently estimating a tight upper bound of the voltage drop. We also present efficient heurists for minimizing the sizes of sleep transistors. Our experimental results are very exciting
  • Keywords
    CMOS integrated circuits; integrated circuit design; leakage currents; distributed sleep transistor network; leakage current; maximum instantaneous current; power gating; sleep transistor area; virtual ground lines; Circuit simulation; Degradation; Estimation theory; Joining processes; Leakage current; Microwave integrated circuits; Performance analysis; Threshold voltage; Timing; Upper bound; Design; IR Drop; Leakage Current; Performance; Power Gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229189
  • Filename
    1688774