Title :
MM-wave near-field scanning resistivity microscope
Author :
Golosovsky, M. ; Davidov, D.
Author_Institution :
Racah Inst. of Phys., Hebrew Univ., Jerusalem, Israel
Abstract :
We have used a near field mm-wave scanning probe to image resistivity of different materials. We compare the near-field to the far-field imaging and find an optimal distance range for the near-field imaging.
Keywords :
electrical conductivity measurement; electrical resistivity; microscopy; millimetre wave imaging; scanning probe microscopy; MM-wave near-field scanning resistivity microscope; Antenna measurements; Bridges; Conductivity; Microscopy; Microwave imaging; Probes; Reflection; Reflectivity; Reflector antennas; Spatial resolution;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596574
