DocumentCode
2469097
Title
MM-wave near-field scanning resistivity microscope
Author
Golosovsky, M. ; Davidov, D.
Author_Institution
Racah Inst. of Phys., Hebrew Univ., Jerusalem, Israel
Volume
3
fYear
1997
fDate
8-13 June 1997
Firstpage
1333
Abstract
We have used a near field mm-wave scanning probe to image resistivity of different materials. We compare the near-field to the far-field imaging and find an optimal distance range for the near-field imaging.
Keywords
electrical conductivity measurement; electrical resistivity; microscopy; millimetre wave imaging; scanning probe microscopy; MM-wave near-field scanning resistivity microscope; Antenna measurements; Bridges; Conductivity; Microscopy; Microwave imaging; Probes; Reflection; Reflectivity; Reflector antennas; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location
Denver, CO, USA
ISSN
0149-645X
Print_ISBN
0-7803-3814-6
Type
conf
DOI
10.1109/MWSYM.1997.596574
Filename
596574
Link To Document