• DocumentCode
    2469252
  • Title

    Fast illegal state identification for improving SAT-based induction

  • Author

    Vimiam, V.C. ; Hsiao, Michael S.

  • Author_Institution
    Dept. of ECE, Virginia Tech, Blacksburg, VA
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    241
  • Lastpage
    246
  • Abstract
    In this paper, we propose a novel framework to quickly extract illegal states of a sequential circuit and then use them as constraints during the SAT-based induction runs. First, we employ a low-cost combinational ATPG to identify unreachable partial-states among groups of related flip-flops. Second, we propose the concept of necessary-assignment looping to identify additional unachievable partial-states. Third, we extend the above unachievability theory to capture new non-trivial sequential logic dependencies among the circuit signals. Finally, we use a unified framework that utilizes all the above information and aims at maximizing the learning. All the learned illegal states are converted into constraint clauses and are replicated at all the unrolled transition relations to prune the search-space. Experimental results show that, due to the added constraints, many safety properties can be proved at earlier depths and the induction run-times can be significantly reduced
  • Keywords
    automatic test pattern generation; flip-flops; logic testing; sequential circuits; SAT-based induction; automatic test pattern generation; circuit signals; combinational ATPG; constraint clauses; flip-flops; illegal state identification; nontrivial sequential logic; search-space; sequential circuit; unreachable partial-states; Automatic test pattern generation; Boolean functions; Data structures; Field programmable gate arrays; Flip-flops; Law; Legal factors; Reachability analysis; Safety; Sequential circuits; ATPG; Algorithms; Induction; Learning; SAT; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229208
  • Filename
    1688796