DocumentCode
2469289
Title
Feature selection with stochastic complexity
Author
Dom, Byron ; Niblack, Wayne ; Sheinvald, Jacob
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
fYear
1989
fDate
4-8 Jun 1989
Firstpage
241
Lastpage
248
Abstract
The application of J. Rissanen´s theory (1986) of stochastic complexity to the problem of features selection in statistical pattern recognition (SPR) is discussed. Stochastic complexity provides a general framework for statistical problems such as coding, prediction, estimation, and classification. A brief review of the SPR paradigm and traditional methods of feature selection is presented, followed by a discussion of the basic of stochastic complexity. Two forms of stochastic complexity, minimum description length and an integral form, are applied to the problem of feature selection. Experimental results using simulated data generated with Gaussian distributions are given and compared with results from cross validation, a traditional technique. The stochastic complexity measures give superior results, as measured by their ability to select subsets of relevant features, as well as probability of error computed based on the selected feature subset
Keywords
error statistics; pattern recognition; picture processing; statistical analysis; stochastic programming; Gaussian distributions; Rissanen´s theory; coding; error probability; features selection; picture processing; prediction; statistical pattern recognition; stochastic complexity; Cognition; Computational modeling; Gaussian distribution; Jacobian matrices; Length measurement; Pattern recognition; Probability; Q measurement; Stochastic processes; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location
San Diego, CA
ISSN
1063-6919
Print_ISBN
0-8186-1952-x
Type
conf
DOI
10.1109/CVPR.1989.37856
Filename
37856
Link To Document