• DocumentCode
    2469441
  • Title

    The Berkeley project management process maturity model: measuring the value of project management

  • Author

    Kwak, Young Hoon ; William, C.

  • Author_Institution
    Dept. of Manage. Sci., George Washington Univ., Washington, DC, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The purpose of the Berkeley project management process maturity model and an associated assessment methodology is to help organizations and people accomplish higher and more sophisticated PM maturity by a systematic and incremental approach. It measures, locates, and compares an organization´s current PM maturity level. The primary advantage of using this model and industries, whereas other maturity models have specific audiences like software development or new product development. The maturity model and assessment technique has already been used to benchmark PM practices and processes in 43 companies. With it, they have also identified relationships between levels of organizational effectiveness and actual project performance data. The model is continuously being refined to reflect advances in their PM knowledge. Some of the most recent improvements include evaluating replicability of project success, which is the focus of this paper and presentation
  • Keywords
    product development; project management; software development management; Berkeley project management process maturity model; assessment methodology; new product development; organizational effectiveness; product development; project performance data; project success replicability; software development; software development management; Capability maturity model; Construction industry; Engineering management; Environmental management; Investments; Manufacturing industries; Product development; Programming; Project management; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering Management Society, 2000. Proceedings of the 2000 IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    0-7803-6442-2
  • Type

    conf

  • DOI
    10.1109/EMS.2000.872466
  • Filename
    872466