• DocumentCode
    2469669
  • Title

    Shielding against design flaws with field repairable control logic

  • Author

    Wagner, Ilya ; Bertacco, Valeria ; Austin, Todd

  • Author_Institution
    Adv. Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    344
  • Lastpage
    347
  • Abstract
    Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs that escape into silicon will only grow in the future. In this paper, we propose a novel hardware patching mechanism that can detect design errors which escaped the verification process, and can correct them directly in the field. We accomplish this goal through a simple field-programmable state matcher, which can identify erroneous configurations in the processor\´s control state and switch the processor into formally-verified degraded performance mode, once a "match" occurs. When the instructions exposing the design flaw are committed, the processor is switched back to normal mode. We show that our approach can detect and correct infrequently-occurring errors with almost no performance impact and has approximately 2% area overhead
  • Keywords
    automatic testing; integrated circuit design; integrated circuit reliability; microprocessor chips; design error detection; design verification; erroneous configuration identification; field repairable control logic; field-programmable state matcher; hardware patching mechanism; microprocessor design; processor verification; Computational modeling; Computer architecture; Computer bugs; Degradation; Error correction; Formal verification; Hardware; Logic design; Pipelines; Switches; Hardware patching; Processor verification; Reliability; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229283
  • Filename
    1688817