DocumentCode :
2469729
Title :
Quasi-clamped Inductive Switching behaviour of power Mosfets
Author :
Havanur, Sanjay
Author_Institution :
Principal Applic. Eng., Alpha & Omega Semicond. Inc, Sunnyvale, CA
fYear :
2008
fDate :
15-19 June 2008
Firstpage :
4349
Lastpage :
4354
Abstract :
Turn off behaviour of power MOSFETS with quasi-clamped inductive switching (QIS) loads is analysed. In most real applications the main inductive load is clamped during turn off but there is enough unclamped inductance in the circuit to cause voltage spikes and avalanche breakdown. This is the QIS situation and occurs in almost all practical circuits from motor drives to inverters to VRMs. Analytical expressions are derived for turn off losses under QIS which take into account the unclamped inductance in the circuit, gate drive parameters and more importantly, the source inductance of the package. The equations also predict the peak voltage during turn off and the conditions that would drive the device into avalanche. A common solution for avalanche prevention during inductive turn off is the protected Mosfet with an integrated drain to gate zener diode. The zener diode forces the Mosfet to turn on, thereby clamping the drain voltage. The trade offs in the design of such protected Mosfets are analysed. The findings are verified in the practical case of a power tool where the motor speed is controlled by PWM operation of a single switch. The circuit has large unclamped inductances arising from wiring and very high peak currents under locked rotor conditions. It is shown that a well designed Mosfet with avalanche protection can survive the locked rotor condition for longer durations, thereby increasing the overall product reliability.
Keywords :
Zener diodes; avalanche breakdown; invertors; motor drives; power MOSFET; switching circuits; PWM operation control; avalanche breakdown; gate drive parameters; gate zener diode; inverters; motor drives; motor speed; peak voltage; power MOSFETS; quasi-clamped inductive switching behaviour; voltage spikes; Avalanche breakdown; Breakdown voltage; Circuits; Diodes; Inductance; MOSFETs; Protection; Pulse width modulation; Rotors; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location :
Rhodes
ISSN :
0275-9306
Print_ISBN :
978-1-4244-1667-7
Electronic_ISBN :
0275-9306
Type :
conf
DOI :
10.1109/PESC.2008.4592644
Filename :
4592644
Link To Document :
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