DocumentCode
2469860
Title
Lifetime prediction for electrical connector under the action of random vibration loading
Author
Chongyang, Zhu ; Qiang, Feng ; Bo, Sun
Author_Institution
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
23-25 May 2012
Firstpage
1
Lastpage
5
Abstract
Electrical connectors play a critical role on systems´ reliability and vibration loading is the critical environmental factor which affects the reliability and lifetime of them. The existing methods to study the lifetime of electrical connectors under the action of vibration loading cannot quantify the response of the electrical connectors, cost high and time-consuming. To solve these problems, the method combined finite element (FE) simulation with failure physics equation was proposed. It can not only be used to quantify the vibration response, predict the lifetime and quantify the limited vibration loading of electrical connectors, but also analysis the reliability and optimization of electrical connector. The response of electrical connectors under external vibration excitation was quantified by FE modeling and simulation first. The relationship between external input vibration loading and local vibration response was established by multiple sets of vibration simulation and data fitting. Then the equation between lifetime of electrical connector and external vibration excitation was established combined with the failure physics equation. Finally, the test data was used to validate the lifetime of electrical connector.
Keywords
electric connectors; finite element analysis; vibrations; critical environmental factor; data fitting; electrical connector lifetime prediction; failure physics equation; finite element simulation; systems´ reliability; vibration excitation; vibration loading; vibration simulation; Analytical models; Connectors; Equations; Load modeling; Mathematical model; Reliability; Vibrations; FE simulation; electrical connectors; lifetime prediction; physics failure equation; vibration;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location
Beijing
ISSN
2166-563X
Print_ISBN
978-1-4577-1909-7
Electronic_ISBN
2166-563X
Type
conf
DOI
10.1109/PHM.2012.6228872
Filename
6228872
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