DocumentCode :
2469877
Title :
Influences on thermal fatigue reliability of QFP component solder joints based on physic-of-failure method
Author :
Wang, Xinghao ; Shao, Jiang ; Liu, Xiaoyu ; Lu, Fengming
Author_Institution :
Quality Eng. Center, China Aero-Polytechnology Establ., Beijing, China
fYear :
2012
fDate :
23-25 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
Physics-of-failure (POF) method based reliability prediction technology is one of the key technologies in prognostic and health management (PHM) field. Based on CalceSARA, a physics-of-failure based reliability assessment software developed by University of Maryland, influences on solder joints thermal fatigue reliability of QFP component were researched in detail, and the influences of six types of parameters such as package material, lead span, lead material, lead thickness, solder height and solder joints bond area on thermal fatigue life of solder joints were analyzed. The results indicated that under temperature cycle loading, the fatigue life of solder joints is positively correlated with solder height and solder joints bond area, and is negatively correlated with lead span and lead thickness, and the fatigue life of components with plastic package and copper alloy lead is longer than components with ceramic package and iron-nickel alloy lead. This study can provide guideline and reference for selection and usage of electronic components in reliability design.
Keywords :
ceramic packaging; copper alloys; iron alloys; nickel alloys; reliability; solders; thermal stress cracking; CalceSARA; Cu; Fe-Ni; Maryland University; QFP component solder joints; ceramic package; electronic components; lead material; lead span; lead thickness; package material; physic-of-failure method; plastic package; prognostic and health management field; reliability assessment software; reliability design; reliability prediction technology; solder height; solder joints bond area; solder joints thermal fatigue reliability; temperature cycle loading; thermal fatigue life; Physics-of-failure; QFP; reliability; solder joints; thermal fatigue life;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
ISSN :
2166-563X
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
Type :
conf
DOI :
10.1109/PHM.2012.6228873
Filename :
6228873
Link To Document :
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