Design of the BIT base on the structure of the radar system

The Built-in Test (BIT) is an important technology that can great improve the testability and diagnosis capability of the system. It has been successfully applied in weapon equipment. As BIT design is made respectively by the product manufacture, there is not a unitive, normal and general standard. There is not a unique evaluation criterion for the fault diagnosis ability of radar BIT too. So this paper illustrates the structure from the system to describe structure function modeling. Analyze the failure effect, fault propagation and failure modes and effects analysis based on the structure model. Bringing forward the design rule and detect method of radar BIT, which can offer the method for analyzing system testability and the design rule of radar BIT, Improving the fault diagnosis ability and system reliability.