Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes

Author

Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Tobar, Michael ; Geyer, R.G.

Author_Institution

Inst. Mikroelektroniki i Optoelektroniki PW, Warsaw, Poland

Volume

3

fYear

1997

fDate

8-13 June 1997

Firstpage

1347

Abstract

Whispering-gallery modes are used for very accurate complex permittivity measurements of both isotropic and uniaxially anisotropic dielectric materials. A mode-matching technique is used to find the relationship between the complex permittivity, resonant frequency, and the dimensions of a resonant structure. The total uncertainty in permittivity is smaller than 0.05 percent and is limited principally by uncertainty in sample dimensions.

Keywords

dielectric materials; dielectric resonators; microwave measurement; mode matching; permittivity measurement; complex permittivity measurement; dielectric resonator; isotropic material; low loss dielectric material; mode-matching; uniaxially anisotropic material; whispering gallery modes; Anisotropic magnetoresistance; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Permittivity measurement; Resonance; Temperature; Whispering gallery modes;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1997., IEEE MTT-S International

Conference_Location

Denver, CO, USA

ISSN

0149-645X

Print_ISBN

0-7803-3814-6

Type

conf

DOI

10.1109/MWSYM.1997.596578

Filename

596578