• DocumentCode
    2470245
  • Title

    Design and experimental validation of a nonlinear tracking control law for an electrostatic micromirror

  • Author

    Agudelo, Carlos G. ; Packirisamy, Muthukumaran ; Zhu, Guchuan ; Saydy, Lahcen

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytech. de Montreal, Montreal, QC, Canada
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    4202
  • Lastpage
    4207
  • Abstract
    This work aims at demonstrating potential benefits of applying nonlinear control techniques to electrostatic micromirrors in order to extend their stable operational range and enhance the system´s performance. A nonlinear tracking control based on feedback linearization and trajectory planning has been developed. Aspects essential to the implementation of such a system, such as prevention of the device from its destruction on contact, modeling and sensing schemes allowing for the removal of on-chip sensors, influence of the dynamics of the driving circuit on the performance, and characterization of the device, have been thoroughly addressed and practical solutions have been proposed. The experimentation is performed on a set-up built with low cost, commercial off-the-shelf (COTS) instruments and components in an ordinary laboratory environment. The experimental results show that the developed control system can achieve a stable operation beyond the pull-in position for both set-point and scanning controls.
  • Keywords
    control system synthesis; electrostatic devices; micromechanical devices; micromirrors; nonlinear control systems; position control; tracking; commercial off-the-shelf instruments; electrostatic micromirrors; feedback linearization; nonlinear tracking control law; on-chip sensors removal; trajectory planning; Control systems; Electrostatics; Linear feedback control systems; Micromirrors; Nonlinear control systems; Sensor phenomena and characterization; Sensor systems; System performance; System-on-a-chip; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160353
  • Filename
    5160353