Title :
Study on data usability judgment method on inherent availability demonstration test
Author :
Fu, Kang ; Yu, Yongli ; Zhang, Liu ; Xu, Ying
Author_Institution :
Maintenance Eng. Lab., Shijiazhuang Mech. Eng. Coll., Shijiazhuang, China
Abstract :
In order to solve the problem on whether inherent availability demonstration test with fixed sample size can make use of reliability qualification test data and maintainability demonstration test data, as well as reliability qualification test and maintainability demonstration test can make use of inherent availability demonstration test data or not, i.e. the problem on judging inherent availability demonstration test data usability, this paper is proposed. Test procedure is designed to meet stated levels of producer and consumer risk, and meeting stated levels of producer and consumer risk is equal to test sample size equals the sample size determined from test procedure. Based on these characteristic, under the assumption that inherent availability demonstration test procedure, reliability qualification test procedure and maintainability demonstration test procedure has been designed completely, in this paper, data usability judgment course, designs judgment rule are studied. And in this paper, we choose the best test operation concept including above three kinds of tests according to rule that the least sum of expecting cost is regarded as target. Finally, it is assumed that system operating time distribution and repair time distribution are exponential, a numerical example is analyzed in this paper.
Keywords :
maintenance engineering; reliability; risk analysis; consumer risk; data usability judgment method; designs judgment rule; inherent availability demonstration test; maintainability demonstration test data; producer risk; reliability qualification test data; repair time distribution; system operating time distribution; test operation concept; data usability; demonstration test; inherent availability; test risk;
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
DOI :
10.1109/PHM.2012.6228945