Disorder limits in passive and amplifying slow light waveguides

Author

Petrov, Alexander Yu ; Krause, Michael ; Wülbern, Jan Hendrik ; Hampe, Jan ; Eich, Manfred

Author_Institution

Inst. of Opt. & Electron. Mater., Hamburg Univ. of Technol., Hamburg, Germany

fYear

2009

fDate

9-11 Sept. 2009

Firstpage

43

Lastpage

45

Abstract

We present a simulation approach to estimate the effect of disorder induced backscattering in slow light photonic crystal line-defect waveguides. The backscattering leads to localization and thus limits the maximal length of such waveguides. Loss in passive waveguides in the localization regime reduces ripples in spectral transmission and group delay whereas gain increases these resonant multiple scattering effects.

Keywords

backscatter; optical losses; optical waveguides; photonic crystals; slow light; amplifying slow light waveguides; disorder induced backscattering; group delay; localization regime; passive slow light waveguides; passive waveguide loss; resonant multiple scattering effects; slow light photonic crystal line-defect waveguides; spectral transmission; Backscatter; Delay effects; Light scattering; Optical losses; Particle scattering; Photonic crystals; Propagation delay; Propagation losses; Resonance light scattering; Slow light;

fLanguage

English

Publisher

ieee

Conference_Titel

Group IV Photonics, 2009. GFP '09. 6th IEEE International Conference on

Conference_Location

San Francisco, CA

ISSN

1949-2081

Print_ISBN

978-1-4244-4402-1

Electronic_ISBN

1949-2081

Type

conf

DOI

10.1109/GROUP4.2009.5338294

Filename

5338294