Title :
Disorder limits in passive and amplifying slow light waveguides
Author :
Petrov, Alexander Yu ; Krause, Michael ; Wülbern, Jan Hendrik ; Hampe, Jan ; Eich, Manfred
Author_Institution :
Inst. of Opt. & Electron. Mater., Hamburg Univ. of Technol., Hamburg, Germany
Abstract :
We present a simulation approach to estimate the effect of disorder induced backscattering in slow light photonic crystal line-defect waveguides. The backscattering leads to localization and thus limits the maximal length of such waveguides. Loss in passive waveguides in the localization regime reduces ripples in spectral transmission and group delay whereas gain increases these resonant multiple scattering effects.
Keywords :
backscatter; optical losses; optical waveguides; photonic crystals; slow light; amplifying slow light waveguides; disorder induced backscattering; group delay; localization regime; passive slow light waveguides; passive waveguide loss; resonant multiple scattering effects; slow light photonic crystal line-defect waveguides; spectral transmission; Backscatter; Delay effects; Light scattering; Optical losses; Particle scattering; Photonic crystals; Propagation delay; Propagation losses; Resonance light scattering; Slow light;
Conference_Titel :
Group IV Photonics, 2009. GFP '09. 6th IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-4402-1
Electronic_ISBN :
1949-2081
DOI :
10.1109/GROUP4.2009.5338294
