Title :
4.25 Gb/s laser driver: design challenges and EDA tool limitations
Author :
Sheahan, Benjamin ; Fattaruso, John W. ; Wong, Jennifer ; Muth, Karlheinz ; Murmann, Boris
Author_Institution :
Stanford Univ., CA
Abstract :
This paper describes the design methodology, simulation, and tools used to design a 4.25 Gb/s high output swing laser driver (LD) and the electrical to optical interface from the LD to the laser diode. The quality of the optical output of a fiber optic communication channel is mainly determined by the LD and the electrical interface from the LD to the laser diode. Of particular importance in the interface is how well the LD overcomes the impact of the parasitic, resistive, capacitive, and inductive elements associated with the bondpad, bondwires, package, PCB transmission lines, passive components, and laser diode and its bondwires. The EDA tools used to model the electrical parasitics focus on RF and microwave applications and provide high frequency S-parameter models. This environment requires a stable time domain model of the electrical to optical interface. The presented LD integrated circuit operates from 155 Mb/s to 4.25 Gb/s with rise and fall times of 70 ps or less and a wide output voltage range, and a modulation current range of 5 mA to 85 mA
Keywords :
S-parameters; driver circuits; electronic design automation; high-speed optical techniques; semiconductor lasers; 1.55 to 4.25 Gbit/s; 5 to 85 mA; EDA tool; LD integrated circuit; S-parameter models; design methodology; electrical parasitics; electrical-to-optical interface; fiber optic communication channel; laser diode; laser driver; time domain model; Bonding; Design methodology; Diode lasers; Distributed parameter circuits; Electronic design automation and methodology; Fiber lasers; Integrated circuit packaging; Optical design; Optical fiber communication; Radio frequency; Laser driver; Measurement; design; electrical to optical interface; laser diode; performance; reliability; verification;
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
1-59593-381-6
DOI :
10.1109/DAC.2006.229243