DocumentCode :
2471747
Title :
Complex system fault sampling under condition of imperfect repair
Author :
Zhang, Chao ; Guo, Linhan ; Xiao, Boping ; Kang, Rui
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2012
fDate :
23-25 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
When complex system corrective maintenance activities are simulated, product fault occasion occurrences are usually simulated by random sampling method to impel corrective maintenance activity simulation to run. Product fault is usually sampled stochastically under complete repair or minimum repair condition in present research, but the product is usually repaired under imperfect repair condition in real world. In order to enhance the simulation model credibility product fault stochastic sampling method based on the arbitrary distribution is proposed under imperfect repair condition, where product failure rates are time-variant. Top-down and down-top failure sampling model is established to each layer product in the complex system, and the model applicability is analyzed. Finally a product fault sampling example according to the top-down method is constructed under imperfect repair conditions It can be concluded that the proposed methodology is of high validity and feasibility in this paper.
Keywords :
condition monitoring; failure analysis; large-scale systems; maintenance engineering; random processes; sampling methods; stochastic processes; complex system fault sampling; corrective maintenance activity simulation model credibility; down-top failure sampling model; imperfect repair condition; model applicability; product failure rate; product fault occasion occurrences; product fault stochastic sampling method; random sampling method; top-down failure sampling model; Computer aided software engineering; Silicon; fault sampling; imperfect repair; monte carlo;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
ISSN :
2166-563X
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
Type :
conf
DOI :
10.1109/PHM.2012.6228962
Filename :
6228962
Link To Document :
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