• DocumentCode
    2471895
  • Title

    6F-1 Trench-Isolated CMUT Arrays with a Supporting Frame: Characterization and Imaging Results

  • Author

    Zhuang, Xuefeng ; Wygant, Ira O. ; Lin, Der-Song ; Kupnik, Mario ; Oralkan, Ömer ; Khuri-Yakub, Butrus T.

  • Author_Institution
    Stanford Univ., Stanford
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    507
  • Lastpage
    510
  • Abstract
    We report on the characterization and imaging results of trench-isolated CMUT arrays with a supporting frame. The CMUT arrays are built on a silicon-on-insulator (SOI) wafer using direct wafer-to-wafer fusion bonding technique. Electrical contacts to individual elements are brought to the back side of the wafer by highly conductive silicon pillars. Mechanical support for array elements is provided by a silicon frame structure. 1D and 2D arrays with 250-mum element pitch were fabricated and tested in air and in immersion. Rectangular membranes are used, which feature two distinctive pull-in (collapse) points in both air and immersion tests. The double collapsing membranes enable an operating frequency ranging from 1.9 MHz in conventional mode to 58 MHz in second collapse mode on the same device. After flip-chip bonding the 2D arrays to custom-designed integrated circuits (IC), volumetric imaging was demonstrated.
  • Keywords
    capacitors; flip-chip devices; micromechanical devices; silicon-on-insulator; ultrasonic imaging; ultrasonic transducer arrays; wafer bonding; 1D CMUT array; 2D CMUT array; SOI wafer; array element mechanical support; capacitive micromachined ultrasonic transducer; direct wafer-wafer fusion bonding technique; double collapsing membrane; flip chip bonding; frequency 1.9 MHz to 58 MHz; rectangular membrane; second collapse mode; silicon on insulator wafer; size 250 mum; trench isolated CMUT array; volumetric imaging; Biomembranes; Circuit testing; Contacts; Electrodes; Fabrication; Frequency; Integrated circuit interconnections; Laboratories; Silicon; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.134
  • Filename
    4409707