DocumentCode :
2472114
Title :
Polarization/radiometric based material classification
Author :
Wolff, Lawrence B. ; Boult, Terrance E.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
fYear :
1989
fDate :
4-8 Jun 1989
Firstpage :
387
Lastpage :
395
Abstract :
A technique for identifying the material properties of objects in an image using multiple images taken through a polarizing lens at various rotations in front of a stationary camera (only the filter moves). Using these images, it is possible to obtain the classification of material surfaces at all points on a spectacular highlight. The algorithm is demonstrated on laboratory images. The authors assume a point source, the theory can only be applied at points where specular reflection dominates. Extensions of the theory to deal with extended light sources, which greatly increase the portion of the image giving rise to specular reflection, are also considered
Keywords :
light polarisation; light sources; polarimetry; radiometry; extended light sources; material classification; point source; polarizing lens; radiometry; specular reflection; Conducting materials; Dielectric materials; Filters; Inspection; Layout; Lenses; Optical materials; Optical reflection; Polarization; Radiometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location :
San Diego, CA
ISSN :
1063-6919
Print_ISBN :
0-8186-1952-x
Type :
conf
DOI :
10.1109/CVPR.1989.37876
Filename :
37876
Link To Document :
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