Title :
Measurement of Complex Coefficients for Thick PVDF Polymer
Author :
Xu, Q.C. ; Ramachandran, A.R. ; Newnham, R.E. ; Tancrel, R.H.
Keywords :
Acoustic applications; Acoustic materials; Dielectric measurements; Frequency dependence; Frequency measurement; Piezoelectric materials; Polymers; Tellurium; Temperature dependence; Thickness measurement;
Conference_Titel :
IEEE 1987 Ultrasonics Symposium
Conference_Location :
Denver, Colorado, USA
DOI :
10.1109/ULTSYM.1987.199041
