Title :
Carrier lifetimes in vertical cavity surface emitting lasers determined from electrical impedance measurements
Author :
Giudice, G.E. ; Kuksenkov, D.V. ; Temkin, H. ; Lear, K.L.
Author_Institution :
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Abstract :
Summary form only given. Differential carrier lifetimes of index-guided oxide-confined (980 nm) vertical cavity surface-emitting lasers (VCSELs) were obtained from laser impedance measurements at subthreshold currents and equivalent circuit modeling
Keywords :
carrier lifetime; electric impedance measurement; equivalent circuits; laser variables measurement; semiconductor device models; semiconductor device testing; semiconductor lasers; surface emitting lasers; 980 nm; carrier lifetimes; differential carrier lifetimes; electrical impedance measurements; equivalent circuit modeling; index-guided oxide-confined 980 nm VCSELs; laser impedance measurements; subthreshold currents; vertical cavity surface emitting lasers; Capacitance; Charge carrier lifetime; Equivalent circuits; Impedance measurement; Laser modes; Optical modulation; Surface emitting lasers; Surface impedance; Surface resistance; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4947-4
DOI :
10.1109/LEOS.1998.739536
