Knowledge-based scheduling of semiconductor testing operations

Author

De, Suranjan ; Kim, Chaiho ; Lee, Anita

Author_Institution

Dept. of Decision & Inf. Sci., Santa Clara Univ., CA, USA

fYear

1995

fDate

20-23 Feb 1995

Firstpage

247

Lastpage

253

Abstract

This paper describes our ongoing efforts to develop a knowledge-based system to support planning and scheduling of semiconductor testing operations. Specifically, we present a knowledge-based scheduling mechanism which is one component of the overall system still under development. We present a knowledge-based heuristic scheduling method and our computational experience with this method on well-known job shop scheduling problems. The scheduling mechanism has been implemented on a Sun Sparc station 1+ using the programming language Common Lisp

Keywords

computer integrated manufacturing; expert systems; heuristic programming; production control; semiconductor device manufacture; semiconductor device testing; Common Lisp; Sun Sparc station 1+; job shop scheduling problems; knowledge-based heuristic scheduling method; knowledge-based scheduling; knowledge-based scheduling mechanism; knowledge-based system; planning; scheduling; semiconductor testing operations; Business; Economic forecasting; Educational institutions; Fabrication; Information systems; Job shop scheduling; Manufacturing processes; Processor scheduling; Semiconductor device manufacture; Semiconductor device testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Artificial Intelligence for Applications, 1995. Proceedings., 11th Conference on

Conference_Location

Los Angeles, CA

Print_ISBN

0-8186-7070-3

Type

conf

DOI

10.1109/CAIA.1995.378816

Filename

378816