Title :
Computing Viable Sets and Reachable Sets to Design Feedback Linearizing Control Laws Under Saturation
Author :
Oishi, Meeko ; Mitchell, Ian ; Tomlin, Claire ; Saint-Pierre, Patrick
Author_Institution :
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
Abstract :
We consider feedback linearizable systems subject to bounded control input and nonlinear state constraints. In a single computation, we synthesize 1) parameterized nonlinear controllers based on feedback linearization, and 2) the set of states over which this controller is valid. This is accomplished through a reachability calculation, in which the state is extended to incorporate input parameters. While we use a Hamilton-Jacobi formulation, a viability approach is also feasible. The result provides a mathematical guarantee that for all states within the computed set, there exists a control law that simultaneously satisfy two separate goals: envelope protection (no violation of state constraints), and stabilization despite saturation. We apply this technique to two real-world systems: the longitudinal dynamics of a civil jet aircraft, and a two-aircraft, planar collision avoidance scenario. The result, in both cases, is a feasible range of input parameters for the nonlinear control law, and a corresponding controlled invariant set
Keywords :
aircraft control; feedback; linearisation techniques; nonlinear control systems; reachability analysis; Hamilton-Jacobi formulation; aircraft planar collision avoidance; civil jet aircraft longitudinal dynamics; controlled invariant set; feedback linearizable system; feedback linearization; feedback linearizing control law; nonlinear control law; nonlinear state constraint; parameterized nonlinear controller; reachability calculation; reachable set; viability approach; viable set; Aerospace control; Aircraft; Contracts; Control systems; Linear feedback control systems; Nonlinear control systems; Protection; State feedback; Testing; Trajectory;
Conference_Titel :
Decision and Control, 2006 45th IEEE Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0171-2
DOI :
10.1109/CDC.2006.377614