Title :
A comparison of high power single-phase power factor correction pre-regulators
Author :
Beltrame, Fernando ; Roggia, Leandro ; Schuch, Luciano ; Pinheiro, José Renes
Author_Institution :
Power Electron. & Control Res. Group - GEPOC, Fed. Univ. of Santa Maria, Santa Maria, Brazil
Abstract :
In this paper, a comparison of three high power single-phase power factor correction (PFC) pre-regulators is proposed. The topologies discussed are the boost converter, the interleaved boost converter and the dual boost converter. The control system used to perform the PFC is based in predictive current control laws and an algorithm to detect the conduction modes is also used, once the converters operate in mixed conduction mode. All topologies have the same input current, input voltage, output voltage, load and controller. Furthermore, all topologies have the same rms current and total harmonic distortion (THD) values of the input current, and, therefore, equal input filters. The comparison parameters are: input power factor, conducted electromagnetic interference (EMI), core losses, power losses, heat-sink volume, total volume, efficiency and number of components and devices. Theoretical and experimental results are presented to analyze the comparisons between the converters.
Keywords :
electric current control; electromagnetic interference; harmonic distortion; power convertors; power factor correction; THD; conduction mode detection; control system; controller; core losses; dual boost converter; electromagnetic interference; equal input filters; heat-sink volume; input current; input voltage; interleaved boost converter; output voltage; power factor correction preregulators; power losses; predictive current control laws; rms current; single-phase PFC preregulators; total harmonic distortion; Control systems; Core loss; Current control; Electromagnetic interference; Power factor correction; Power harmonic filters; Reactive power; Topology; Total harmonic distortion; Voltage control;
Conference_Titel :
Industrial Technology (ICIT), 2010 IEEE International Conference on
Conference_Location :
Vi a del Mar
Print_ISBN :
978-1-4244-5695-6
Electronic_ISBN :
978-1-4244-5696-3
DOI :
10.1109/ICIT.2010.5472730